Impact of Self-Heating Effect on DC and AC Performance of FD-SOI CMOS Inverter

IF 2 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Kang Hee Lee;Mincheol Kim;Jongmin Lee;Jang Hyun Kim
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Abstract

We analyzed the impact of self-heating effect (SHE) on fully depleted-silicon on insulator (FD-SOI) CMOS inverter at the 28 nm technology node, considering both DC and AC operations. Specifically, we focused on investigating the principles behind how SHE influences inverter operating characteristics. To analyze the operating characteristics, we employed 2-D technology computer-aided design (TCAD) mixed mode simulation by Synopsys SentaurusTM. In DC operation, the maximum lattice temperature for n-MOSFET and p-MOSFET are 436 K and 449 K, respectively, resulting in a current degradation of 7.9%. Due to the shifted p/n ratio, the gain also varied, with values of 3.65 V/V for without SHE and 4.21 V/V for with SHE. In AC operation, the maximum temperature varies for each operating frequency: 439 K, 358 K, 324 K, and 319 K, from 10 MHz to 4 GHz. Consequently, the rate of p/n ratio deviation and the rate of voltage change over time vary accordingly. SHE exhibits a faster rate of change, showing a difference of 5.43% at 10 MHz. Analysis of propagation delay through an inverter chain showed a 10% increase at 10 MHz. The results indicate that with SHE, the propagation delay increases, and the slew rate becomes steeper, suggesting improved switching characteristics and gain. However, this unintended consequence highlights the necessity of considering SHE-induced changes in CMOS inverter design to ensure reliable operation.
自热效应对FD-SOI CMOS逆变器直流和交流性能的影响
我们分析了自热效应(SHE)对28纳米技术节点上完全耗尽绝缘体硅(FD-SOI) CMOS逆变器的影响,同时考虑了直流和交流操作。具体来说,我们重点研究了SHE如何影响逆变器工作特性的原理。为分析其工作特性,采用Synopsys SentaurusTM软件进行二维计算机辅助设计(TCAD)混合模式仿真。在直流工作中,n-MOSFET和p-MOSFET的最大晶格温度分别为436 K和449 K,导致电流衰减7.9%。由于p/n比的变化,增益也发生了变化,无SHE时为3.65 V/V,有SHE时为4.21 V/V。交流工作时,在10mhz ~ 4ghz范围内,439k、358k、324k、319k的工作频率下,最高工作温度不同。因此,p/n比偏差率和电压随时间变化的速率也相应变化。SHE表现出更快的变化率,在10 MHz时显示出5.43%的差异。通过逆变器链的传播延迟分析表明,在10mhz时增加10%。结果表明,采用SHE后,传输延迟增大,转换速率变陡,开关特性和增益得到改善。然而,这种意想不到的后果强调了在CMOS逆变器设计中考虑she引起的变化以确保可靠运行的必要性。
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来源期刊
IEEE Journal of the Electron Devices Society
IEEE Journal of the Electron Devices Society Biochemistry, Genetics and Molecular Biology-Biotechnology
CiteScore
5.20
自引率
4.30%
发文量
124
审稿时长
9 weeks
期刊介绍: The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.
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