A Method for Measuring the Complex Refractive Index of Low-Volume Materials Using Integrated Terahertz Time-Domain Transmissometry

IF 3.9 2区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-10-04 DOI:10.1109/TTHZ.2024.3475041

Raphaël Pederiva;Philippe Artillan;Clément Geffroy;Christopher Bäuerle;Jean-François Roux

引用次数: 0

Abstract

This study presents the development of an on-chip terahertz characterization process for low-volume or thin-film materials. A time-domain method based on the transmission of picosecond electrical pulses through the material to be characterized is proposed to determine the complex refractive index of materials up to hundreds of gigahertz. We demonstrate the capability of this method by determining the complex refractive index of a 15 nL droplet of glycerol over the 50–550 GHz frequency range.

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利用集成太赫兹时域透射测量小体积材料复折射率的方法

本研究提出了一种用于小体积或薄膜材料的片上太赫兹表征工艺的发展。提出了一种基于皮秒电脉冲在被表征材料中的传输的时域方法，用于测定高达数百千兆赫的材料的复折射率。我们通过在50-550 GHz频率范围内测定15 nL甘油液滴的复折射率来证明该方法的能力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Terahertz Science and Technology ENGINEERING, ELECTRICAL & ELECTRONIC-OPTICS

CiteScore

7.10

自引率

9.40%

发文量

102

期刊介绍： IEEE Transactions on Terahertz Science and Technology focuses on original research on Terahertz theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of Terahertz waves.