{"title":"Suppressing the Dark Current of PbS QD SWIR Photodetector by Freeze-Treated Hole Transport Layer","authors":"Fan Fang;Weichao Wang;Yiwen Li;Xiao Wang;Lihai Xu;Simin Chen;Tao Cao;Haibo Zhu;Lei Rao;Kaiyu Luo;Jun Tang;Yulong Chen;Junjie Hao;Wei Chen;Haodong Tang","doi":"10.1109/LED.2024.3496412","DOIUrl":null,"url":null,"abstract":"Lead sulfide (PbS) quantum dot (QD) photodetector is considered as a key component of the next-generation infrared machine vision applications for its wide detection range and effective fabrication cost. Leakage current caused by film cracks and trap states during the film fabrication stops the further optimization of device performance and slows down the industrialization of the PbS QD photodetector. An optimized hole transport layer based on PbS QD with minimized cracks and trap states is achieved through a freeze-centrifugation purification before the ligand-exchange process, leading to a suppressed dark current density (260 nA/cm\n<inline-formula> <tex-math>$^{{2}}\\text {)}$ </tex-math></inline-formula>\n, strongly reduced noise current (26 fA/Hz\n<inline-formula> <tex-math>$^{{1}{/{2}}}\\text {)}$ </tex-math></inline-formula>\n. Enhanced film quality brings an ultra-high detectivity (\n<inline-formula> <tex-math>${5}.{47}\\times {10} ^{{12}}$ </tex-math></inline-formula>\nJones) and faster response-time (\n<inline-formula> <tex-math>$1.4\\mu$ </tex-math></inline-formula>\ns) of the freeze-treated photodetector under zero bias.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 1","pages":"52-55"},"PeriodicalIF":4.1000,"publicationDate":"2024-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10750841/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Lead sulfide (PbS) quantum dot (QD) photodetector is considered as a key component of the next-generation infrared machine vision applications for its wide detection range and effective fabrication cost. Leakage current caused by film cracks and trap states during the film fabrication stops the further optimization of device performance and slows down the industrialization of the PbS QD photodetector. An optimized hole transport layer based on PbS QD with minimized cracks and trap states is achieved through a freeze-centrifugation purification before the ligand-exchange process, leading to a suppressed dark current density (260 nA/cm
$^{{2}}\text {)}$
, strongly reduced noise current (26 fA/Hz
$^{{1}{/{2}}}\text {)}$
. Enhanced film quality brings an ultra-high detectivity (
${5}.{47}\times {10} ^{{12}}$
Jones) and faster response-time (
$1.4\mu$
s) of the freeze-treated photodetector under zero bias.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.