Munirah A. Almessiere, Yassine Slimani, Norah A. Algarou, Maksim G. Vakhitov, Denis S. Klygach, Abdulhadi Baykal, Tatyana I. Zubar, Sergei V. Trukhanov, Alex V. Trukhanov, Hussein Attia, Murat Sertkol, Ismail A. Auwal
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引用次数: 0
Abstract
Adv. Electron. Mater. 2022, 8, 2101124
DOI: 10.1002/aelm.202101124
There is an error in Figure 2 in the original published version of the article (https://doi.org/10.1002/aelm.202101124). One SEM (x = 0.035) was unintentionally zoomed from another image. Fortunately, none of the other results were affected by this unintentional error. The corrected version of Figure 2 is attached.
Original figure:
Corrected figure:
Figure 2. SEM images of SrBaSc/NiFe H/S (x ≤ 0.035) NCs.
期刊介绍:
Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.