Prototype of Flexible Digital X-Ray Imaging Detector

IF 4.1 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Seyeoul Kwon;Charles Andrew Parker;Kristofer Paetow;Hunter Reed;Sara Chahid;Geun Jo Han;Agus Widjaja;Jinhui Cho;Kevin Cadena;Kevin Granaas;Jerome Crocco
{"title":"Prototype of Flexible Digital X-Ray Imaging Detector","authors":"Seyeoul Kwon;Charles Andrew Parker;Kristofer Paetow;Hunter Reed;Sara Chahid;Geun Jo Han;Agus Widjaja;Jinhui Cho;Kevin Cadena;Kevin Granaas;Jerome Crocco","doi":"10.1109/LED.2024.3478777","DOIUrl":null,"url":null,"abstract":"This letter presents the development of a flexible digital X-ray imaging detector based on flat panel display manufacturing principles. The detector array was fabricated using amorphous silicon thin-film transistors (a-Si TFTs) on flexible polyimide (PI) substrate. The TFT characteristics of the flexible detector array show comparable performance to the glass substrate detector array. The field effect mobility (\n<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>\n) of a-Si TFT on flexible substrate was 0.66 cm2/V\n<inline-formula> <tex-math>$\\cdot $ </tex-math></inline-formula>\ns, the thresholder voltage (VT) was 4.21 V, the subthreshold slops (SS) was 0.42 V/decade, and the off-current (IOFF) was about \n<inline-formula> <tex-math>$6.5\\times 10^{-{14}}$ </tex-math></inline-formula>\n A. The X-ray image was 161 mm \n<inline-formula> <tex-math>$\\times$ </tex-math></inline-formula>\n 215 mm in size. The environmental reliability of the flexible detector were tested using thermal and conditions of 65°C at a relative humidity (RH) of 70%. Furthermore, temperature cycling between −20°C/+60°C was used to test the flexible detectors and which also shown acceptable passing results for commercialization. The preliminary studying results demonstrate the feasibility of a flexible X-ray imaging detector, which could have significant implications for the medical imaging industry.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"45 12","pages":"2439-2442"},"PeriodicalIF":4.1000,"publicationDate":"2024-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10715497/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

This letter presents the development of a flexible digital X-ray imaging detector based on flat panel display manufacturing principles. The detector array was fabricated using amorphous silicon thin-film transistors (a-Si TFTs) on flexible polyimide (PI) substrate. The TFT characteristics of the flexible detector array show comparable performance to the glass substrate detector array. The field effect mobility ( $\mu $ ) of a-Si TFT on flexible substrate was 0.66 cm2/V $\cdot $ s, the thresholder voltage (VT) was 4.21 V, the subthreshold slops (SS) was 0.42 V/decade, and the off-current (IOFF) was about $6.5\times 10^{-{14}}$ A. The X-ray image was 161 mm $\times$ 215 mm in size. The environmental reliability of the flexible detector were tested using thermal and conditions of 65°C at a relative humidity (RH) of 70%. Furthermore, temperature cycling between −20°C/+60°C was used to test the flexible detectors and which also shown acceptable passing results for commercialization. The preliminary studying results demonstrate the feasibility of a flexible X-ray imaging detector, which could have significant implications for the medical imaging industry.
柔性数字x射线成像探测器样机
这封信介绍了基于平板显示器制造原理的柔性数字x射线成像探测器的发展。探测器阵列采用非晶硅薄膜晶体管(a-Si TFTs)在柔性聚酰亚胺(PI)衬底上制备。柔性探测器阵列的TFT特性显示出与玻璃基板探测器阵列相当的性能。柔性衬底上a-Si TFT的场效应迁移率($\mu $)为0.66 cm2/V $\cdot $ s,阈值电压(VT)为4.21 V,亚阈值斜率(SS)为0.42 V/decade,关断电流(IOFF)约为6.5\ × 10^{-{14}}$ a, x射线图像尺寸为161 mm × 21.5 mm。在温度和相对湿度(RH)为70%、温度为65℃的条件下,对柔性探测器的环境可靠性进行了测试。此外,在- 20°C/+60°C之间的温度循环用于测试柔性探测器,并且也显示出可接受的商业化通过结果。初步研究结果证明了柔性x射线成像探测器的可行性,这可能对医学成像行业产生重大影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Electron Device Letters
IEEE Electron Device Letters 工程技术-工程:电子与电气
CiteScore
8.20
自引率
10.20%
发文量
551
审稿时长
1.4 months
期刊介绍: IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
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