Seyeoul Kwon;Charles Andrew Parker;Kristofer Paetow;Hunter Reed;Sara Chahid;Geun Jo Han;Agus Widjaja;Jinhui Cho;Kevin Cadena;Kevin Granaas;Jerome Crocco
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引用次数: 0
Abstract
This letter presents the development of a flexible digital X-ray imaging detector based on flat panel display manufacturing principles. The detector array was fabricated using amorphous silicon thin-film transistors (a-Si TFTs) on flexible polyimide (PI) substrate. The TFT characteristics of the flexible detector array show comparable performance to the glass substrate detector array. The field effect mobility (
$\mu $
) of a-Si TFT on flexible substrate was 0.66 cm2/V
$\cdot $
s, the thresholder voltage (VT) was 4.21 V, the subthreshold slops (SS) was 0.42 V/decade, and the off-current (IOFF) was about
$6.5\times 10^{-{14}}$
A. The X-ray image was 161 mm
$\times$
215 mm in size. The environmental reliability of the flexible detector were tested using thermal and conditions of 65°C at a relative humidity (RH) of 70%. Furthermore, temperature cycling between −20°C/+60°C was used to test the flexible detectors and which also shown acceptable passing results for commercialization. The preliminary studying results demonstrate the feasibility of a flexible X-ray imaging detector, which could have significant implications for the medical imaging industry.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.