{"title":"Dark Current Performance Enhancement in Type-II Superlattice Photodetectors via pBn Barrier Engineering","authors":"Pooja Kawde;Anuja Singh;Bhaskaran Muralidharan","doi":"10.1109/TED.2024.3488683","DOIUrl":null,"url":null,"abstract":"Type-II superlattices (T2SLs) are currently technologically favored absorbers for infrared (IR) photodetectors due to their tunable band gap, lower Auger recombination rates, and higher effective masses in comparison to traditional bulk ternary alloys such as HgCdTe. The pBn barrier configuration is usually preferred to improve the dark current characteristics of the InAs/GaSb T2SL IR photodetectors. To investigate conclusively the impact of a barrier on the dark current, we present a comprehensive study featuring a pBn and a p-i-n device configuration at 77 K. In the pBn configuration, the doping levels in the barrier and absorber layer suppress the band-to-band tunneling (BTBT) and the trap-assisted tunneling (TAT) current dominates. In the p-i-n detector, the TAT current prevails with a small contribution of BTBT current near \n<inline-formula> <tex-math>${V}=-1~\\text {V}$ </tex-math></inline-formula>\n, as a function of absorber doping. It is shown that the pBn detector exhibits 104 times less TAT current when compared with the p-i-n detector at \n<inline-formula> <tex-math>${V}=-{0.1}~\\text {V}$ </tex-math></inline-formula>\n. As the dark current varies with the number of monolayers of InAs and GaSb in a given period, we then focus on the dark current minimization of three pBn detectors with an absorber layer consisting of a symmetric superlattice (SL), InAs-rich SL, and GaSb-rich SL each with an energy band gap of 0.23 eV. We conclusively ascertain and demonstrate the barrier and absorber configurations along with the bias conditions that minimize the dark currents thereby setting a stage to systematically engineer barriers with the aim of minimizing dark currents via a component-by-component analysis.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"71 12","pages":"7628-7636"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10752924/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Type-II superlattices (T2SLs) are currently technologically favored absorbers for infrared (IR) photodetectors due to their tunable band gap, lower Auger recombination rates, and higher effective masses in comparison to traditional bulk ternary alloys such as HgCdTe. The pBn barrier configuration is usually preferred to improve the dark current characteristics of the InAs/GaSb T2SL IR photodetectors. To investigate conclusively the impact of a barrier on the dark current, we present a comprehensive study featuring a pBn and a p-i-n device configuration at 77 K. In the pBn configuration, the doping levels in the barrier and absorber layer suppress the band-to-band tunneling (BTBT) and the trap-assisted tunneling (TAT) current dominates. In the p-i-n detector, the TAT current prevails with a small contribution of BTBT current near
${V}=-1~\text {V}$
, as a function of absorber doping. It is shown that the pBn detector exhibits 104 times less TAT current when compared with the p-i-n detector at
${V}=-{0.1}~\text {V}$
. As the dark current varies with the number of monolayers of InAs and GaSb in a given period, we then focus on the dark current minimization of three pBn detectors with an absorber layer consisting of a symmetric superlattice (SL), InAs-rich SL, and GaSb-rich SL each with an energy band gap of 0.23 eV. We conclusively ascertain and demonstrate the barrier and absorber configurations along with the bias conditions that minimize the dark currents thereby setting a stage to systematically engineer barriers with the aim of minimizing dark currents via a component-by-component analysis.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.