Shuning Zhang;Fansen Cao;Haoyu Lu;Yingfen Wei;Xuanyu Zhao;Hao Jiang;Xiaobing Yan;Qi Liu
{"title":"Interface Engineering on Ferroelectricity of Transparent Hf₀.₅Zr₀.₅O₂ Ferroelectric Capacitors","authors":"Shuning Zhang;Fansen Cao;Haoyu Lu;Yingfen Wei;Xuanyu Zhao;Hao Jiang;Xiaobing Yan;Qi Liu","doi":"10.1109/LED.2024.3485077","DOIUrl":null,"url":null,"abstract":"In this study, we explore the transparent hafnia-based ferroelectric capacitors (FeCaps), employing transparent indium tin oxide (ITO) as the electrode and quartz as substrate. Through interface engineering, involving a Ti interlayer between the ferroelectric Hf\n<inline-formula> <tex-math>$_{{0}.{5}}$ </tex-math></inline-formula>\nZr\n<inline-formula> <tex-math>$_{{0}.{5}}$ </tex-math></inline-formula>\nO2 (HZO) film and the electrodes, we not only achieve a substantial enhancement in polarization, but also manage to process within a reduced thermal budget (\n<inline-formula> <tex-math>$350~^{\\text {o}}$ </tex-math></inline-formula>\nC) compatible with back end of line (BEOL). The bottom interface is demonstrated to play the major role in improving the ferroelectric properties. Moreover, the transparent FeCaps exhibit a maximum transmittance of about 90% close to the bare substrate under visible light. These findings pave the way for hafnia-based FeCaps in the future advancement of transparent electronics.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"45 12","pages":"2347-2350"},"PeriodicalIF":4.1000,"publicationDate":"2024-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10731895/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, we explore the transparent hafnia-based ferroelectric capacitors (FeCaps), employing transparent indium tin oxide (ITO) as the electrode and quartz as substrate. Through interface engineering, involving a Ti interlayer between the ferroelectric Hf
$_{{0}.{5}}$
Zr
$_{{0}.{5}}$
O2 (HZO) film and the electrodes, we not only achieve a substantial enhancement in polarization, but also manage to process within a reduced thermal budget (
$350~^{\text {o}}$
C) compatible with back end of line (BEOL). The bottom interface is demonstrated to play the major role in improving the ferroelectric properties. Moreover, the transparent FeCaps exhibit a maximum transmittance of about 90% close to the bare substrate under visible light. These findings pave the way for hafnia-based FeCaps in the future advancement of transparent electronics.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.