Multifrequency electrical impedance tomography system based on undersampling combined with a fast digital demodulation algorithm.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Jinzhen Liu, Yapeng Zhou, Hui Xiong, Xiaobin Li, Fangming Shi
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引用次数: 0

Abstract

Multifrequency electrical impedance tomography (MFEIT) has shown great application prospects in the field of biomedical imaging. To realize high-precision multifrequency electrical impedance information acquisition, a high-precision MFEIT system with undersampling combined with a fast digital demodulation algorithm is proposed. The system is integrated with 16 electrodes, and semi-parallel acquisition is used. In addition, a novel multifrequency digital demodulation algorithm is applied to enhance the accuracy of multifrequency excitation signal demodulation and achieve rapid demodulation. This improvement is achieved by analyzing the process of the multifrequency digital demodulation algorithm and combining undersampling with a fast digital demodulation technique. To evaluate the proposed method, a systematic comparative experiment is conducted. The experimental results demonstrate that the demodulation error using the undersampling method is less than 0.7% within the frequency range of 5-500 kHz. In addition, the system achieves a maximum signal-to-noise ratio of 62.92 dB, an average blur radius of 0.953, and an average position error percentage of 9.3%. The results indicate that the MFEIT system constructed based on the above research has good performance and a high signal-to-noise ratio.

基于欠采样结合快速数字解调算法的多频率电阻抗断层成像系统。
多频电阻抗断层成像(MFEIT)在生物医学成像领域有着广阔的应用前景。为了实现高精度多频电阻抗信息采集,本文提出了一种结合了欠采样和快速数字解调算法的高精度多频电阻抗层析成像系统。该系统集成了 16 个电极,采用半并行采集方式。此外,还应用了一种新型多频数字解调算法,以提高多频激励信号解调的准确性并实现快速解调。这一改进是通过分析多频数字解调算法的过程,并将欠采样与快速数字解调技术相结合实现的。为了评估所提出的方法,我们进行了系统的对比实验。实验结果表明,在 5-500 kHz 频率范围内,使用欠采样方法的解调误差小于 0.7%。此外,系统的最大信噪比为 62.92 dB,平均模糊半径为 0.953,平均位置误差百分比为 9.3%。结果表明,在上述研究基础上构建的 MFEIT 系统具有良好的性能和较高的信噪比。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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