Magnetic force microscopy: High quality-factor two-pass mode.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Christopher Habenschaden, Sibylle Sievers, Alexander Klasen, Andrea Cerreta, Hans Werner Schumacher
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Abstract

Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial resolution and field sensitivity can be significantly improved by measuring in vacuum conditions. This improvement originates from the higher quality-factor (Q-factor) of the cantilever's oscillation in vacuum compared to ambient conditions. However, while high Q-factors are desirable as they directly enhance the magnetic measurement signal, they pose a challenge when performing standard MFM two-pass (lift) mode measurements. At high Q-factors, amplitude-based topography measurements become impossible, and the MFM phase response behaves non-linearly. Here, we present a modified two-pass mode implementation in a vacuum atomic force microscope that addresses these issues. By controlling the Q-factor in the first pass and using a phase-locked loop technique in the second pass, high Q-factor measurements in vacuum are enabled. Measuring the cantilever's frequency shift instead of the phase shift eliminates the issue of emerging nonlinearities. The improvements in MFM signal-to-noise ratio are demonstrated using a nano-patterned magnetic sample. The elimination of non-linear responses is highlighted through measurements performed on a well-characterized multilayer reference sample. Finally, we discuss a technique that avoids topography-induced artifacts by following the average sample slope. The newly developed, sensitive, and distortion-free high quality-factor two-pass mode has the potential to be widely implemented in commercial setups, facilitating high-resolution MFM measurements and advancing studies of modern magnetic materials.

磁力显微镜:高质量系数双通道模式
磁力显微镜(MFM)是扫描探针显微镜中一项成熟的技术,可对磁性样品进行成像,空间分辨率可达数十纳米,杂散磁场可低至 mT 范围。通过在真空条件下进行测量,空间分辨率和磁场灵敏度可得到显著提高。这种改进源于悬臂在真空条件下的振荡比环境条件下的振荡具有更高的品质因数(Q 因子)。然而,虽然高 Q 因子可直接增强磁性测量信号,因此非常可取,但在执行标准 MFM 双通道(提升)模式测量时却带来了挑战。在高 Q 因子条件下,基于振幅的地形测量变得不可能,而且 MFM 相位响应表现为非线性。在此,我们提出了一种在真空原子力显微镜中实施的改进型双通模式,以解决这些问题。通过在第一通道中控制 Q 因子,并在第二通道中使用锁相环技术,可以在真空中进行高 Q 因子测量。测量悬臂的频率偏移而不是相移消除了新出现的非线性问题。使用纳米图案磁性样品证明了 MFM 信噪比的改进。通过在特性良好的多层参考样品上进行测量,消除了非线性响应。最后,我们讨论了一种通过跟踪平均样品斜率来避免地形引起的伪影的技术。新开发的高灵敏度、无失真的高品质因数双通模式有可能在商用装置中广泛应用,从而促进高分辨率 MFM 测量并推动现代磁性材料的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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