Long-Channel Effects in Randomly Oriented Carbon Nanotube Thin Film Transistors

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Hai-Yang Liu, Panpan Zhang, Xianmao Cao, Yang Zhang, Jianping He, Maguang Zhu, Mengmeng Xiao, Zhiyong Zhang
{"title":"Long-Channel Effects in Randomly Oriented Carbon Nanotube Thin Film Transistors","authors":"Hai-Yang Liu, Panpan Zhang, Xianmao Cao, Yang Zhang, Jianping He, Maguang Zhu, Mengmeng Xiao, Zhiyong Zhang","doi":"10.1002/aelm.202400660","DOIUrl":null,"url":null,"abstract":"Carbon nanotube (CNT) thin film transistors (TFTs) have demonstrated great potential for application in highly sensitive biosensors and large-area electronics. However, research on the electrical behavior of long-channel CNT TFTs is lacking; thus, the purposeful improvement in the performance of biosensors or circuits is difficult. In this study, the electrical transport characteristics of ionic-liquid-gate CNT TFTs with channel lengths (<i>L</i><sub>ch</sub>) ranging from 10 to 400 µm are investigated. The CNT TFTs present classical drift-diffusion transport at on-state with a carrier mobility of around 27 cm<sup>2</sup> V<sup>−1</sup> s<sup>−1</sup>. In the subthreshold region of the CNT TFTs, an abnormal <i>L</i><sub>ch</sub>-dependent subthreshold swing (SS) relationship, named as the long-channel effect (LCE)is observed, where SS worsens with increasing <i>L</i><sub>ch</sub>. The existence of the junctions between the CNTs results in an unconventional density of states for carriers and a large series resistance for sharing the gate voltage; this dominates the abnormal scaling behavior in the subthreshold region by degrading the electrostatic integrity. The discovery of the abnormal LCE can aid in the construction of device models and purposefully improve the performance of CNT TFTs for biosensors and other large-scale electronic applications.","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"18 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2024-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/aelm.202400660","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Carbon nanotube (CNT) thin film transistors (TFTs) have demonstrated great potential for application in highly sensitive biosensors and large-area electronics. However, research on the electrical behavior of long-channel CNT TFTs is lacking; thus, the purposeful improvement in the performance of biosensors or circuits is difficult. In this study, the electrical transport characteristics of ionic-liquid-gate CNT TFTs with channel lengths (Lch) ranging from 10 to 400 µm are investigated. The CNT TFTs present classical drift-diffusion transport at on-state with a carrier mobility of around 27 cm2 V−1 s−1. In the subthreshold region of the CNT TFTs, an abnormal Lch-dependent subthreshold swing (SS) relationship, named as the long-channel effect (LCE)is observed, where SS worsens with increasing Lch. The existence of the junctions between the CNTs results in an unconventional density of states for carriers and a large series resistance for sharing the gate voltage; this dominates the abnormal scaling behavior in the subthreshold region by degrading the electrostatic integrity. The discovery of the abnormal LCE can aid in the construction of device models and purposefully improve the performance of CNT TFTs for biosensors and other large-scale electronic applications.

Abstract Image

随机取向碳纳米管薄膜晶体管中的长沟道效应
碳纳米管(CNT)薄膜晶体管(TFT)在高灵敏度生物传感器和大面积电子器件中的应用潜力巨大。然而,有关长沟道 CNT TFT 电学行为的研究还很缺乏,因此很难有针对性地提高生物传感器或电路的性能。本研究调查了通道长度(Lch)在 10 到 400 µm 之间的离子液体栅 CNT TFT 的电传输特性。这些 CNT TFT 在导通状态下具有经典的漂移-扩散传输特性,载流子迁移率约为 27 cm2 V-1 s-1。在 CNT TFT 的亚阈值区,观察到一种与 Lch 相关的异常亚阈值摆动(SS)关系,即长沟道效应(LCE),其中 SS 随 Lch 的增加而恶化。由于 CNT 之间存在结点,导致载流子的态密度非常规,分担栅极电压的串联电阻很大;这通过降低静电完整性,主导了亚阈值区的异常缩放行为。异常 LCE 的发现有助于构建器件模型,并有针对性地提高用于生物传感器和其他大规模电子应用的 CNT TFT 的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信