Yusi Wang , Tingting Zheng , Pengyuan Wu , Chenying Yang , Oleksiy V. Penkov , Yujie Liu , Kaixin Yuan , Yan Cheng , Yueguang Zhang , Weidong Shen
{"title":"Hard antireflection coatings with enhanced mechanical properties based on gradient structure","authors":"Yusi Wang , Tingting Zheng , Pengyuan Wu , Chenying Yang , Oleksiy V. Penkov , Yujie Liu , Kaixin Yuan , Yan Cheng , Yueguang Zhang , Weidong Shen","doi":"10.1016/j.tsf.2024.140545","DOIUrl":null,"url":null,"abstract":"<div><div>Antireflection (AR) coatings with sapphire-like hardness are highly desired in various applications. Traditionally, hard AR coatings resist penetration, scratching, and abrasion by depositing a hard layer, such as silicon nitride (Si<sub>3</sub>N<sub>4</sub>), with a 1 to 2 µm thickness. However, thick Si<sub>3</sub>N<sub>4</sub> thin films, fabricated by high-energy inductively coupled plasma assisted (ICP-assisted) sputtering, often introduce high residual stress, leading to severe buckling problems when the surface is scratched. To address these challenges, we employ a \"Step up-step down\" design method, integrating a hardness gradient structure with a series of SiO<sub>x</sub>N<sub>y</sub> films. This approach achieves high optical transmittance (Tave > 98.7 % at 420–720 nm), low residual stress (∼680 MPa), improved scratch resistance, and strong adhesion at the film-substrate interface (L<sub>C3</sub> ∼180 mN). Our findings demonstrate significant potential for various mechanical and optical applications, including automotive and consumer electronics devices.</div></div>","PeriodicalId":23182,"journal":{"name":"Thin Solid Films","volume":"807 ","pages":"Article 140545"},"PeriodicalIF":2.0000,"publicationDate":"2024-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin Solid Films","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0040609024003468","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}
引用次数: 0
Abstract
Antireflection (AR) coatings with sapphire-like hardness are highly desired in various applications. Traditionally, hard AR coatings resist penetration, scratching, and abrasion by depositing a hard layer, such as silicon nitride (Si3N4), with a 1 to 2 µm thickness. However, thick Si3N4 thin films, fabricated by high-energy inductively coupled plasma assisted (ICP-assisted) sputtering, often introduce high residual stress, leading to severe buckling problems when the surface is scratched. To address these challenges, we employ a "Step up-step down" design method, integrating a hardness gradient structure with a series of SiOxNy films. This approach achieves high optical transmittance (Tave > 98.7 % at 420–720 nm), low residual stress (∼680 MPa), improved scratch resistance, and strong adhesion at the film-substrate interface (LC3 ∼180 mN). Our findings demonstrate significant potential for various mechanical and optical applications, including automotive and consumer electronics devices.
期刊介绍:
Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.