C Ramesh Babu Durai,R Sathesh Raaj,Sindhu Chandra Sekharan,V S Nishok
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引用次数: 0
Abstract
BACKGROUND
Content-based image retrieval (CBIR) systems are vital for managing the large volumes of data produced by medical imaging technologies. They enable efficient retrieval of relevant medical images from extensive databases, supporting clinical diagnosis, treatment planning, and medical research.
OBJECTIVE
This study aims to enhance CBIR systems' effectiveness in medical image analysis by introducing the VisualSift Ensembling Integration with Attention Mechanisms (VEIAM). VEIAM seeks to improve diagnostic accuracy and retrieval efficiency by integrating robust feature extraction with dynamic attention mechanisms.
METHODS
VEIAM combines Scale-Invariant Feature Transform (SIFT) with selective attention mechanisms to emphasize crucial regions within medical images dynamically. Implemented in Python, the model integrates seamlessly into existing medical image analysis workflows, providing a robust and accessible tool for clinicians and researchers.
RESULTS
The proposed VEIAM model demonstrated an impressive accuracy of 97.34% in classifying and retrieving medical images. This performance indicates VEIAM's capability to discern subtle patterns and textures critical for accurate diagnostics.
CONCLUSIONS
By merging SIFT-based feature extraction with attention processes, VEIAM offers a discriminatively powerful approach to medical image analysis. Its high accuracy and efficiency in retrieving relevant medical images make it a promising tool for enhancing diagnostic processes and supporting medical research in CBIR systems.
期刊介绍:
Research areas within the scope of the journal include:
Interaction of x-rays with matter: x-ray phenomena, biological effects of radiation, radiation safety and optical constants
X-ray sources: x-rays from synchrotrons, x-ray lasers, plasmas, and other sources, conventional or unconventional
Optical elements: grazing incidence optics, multilayer mirrors, zone plates, gratings, other diffraction optics
Optical instruments: interferometers, spectrometers, microscopes, telescopes, microprobes