PCB defect detection algorithm based on deep learning

IF 3.1 3区 物理与天体物理 Q2 Engineering
Optik Pub Date : 2024-09-10 DOI:10.1016/j.ijleo.2024.172036
{"title":"PCB defect detection algorithm based on deep learning","authors":"","doi":"10.1016/j.ijleo.2024.172036","DOIUrl":null,"url":null,"abstract":"<div><p>Deep learning gained great popularity in the task of object detection. This paper proposes a printed circuit board (PCB) defect detection algorithm based on deep learning, which can improve product quality and avoid potential failures and accidents in the electronics manufacturing industry. In this paper, the YOLOv7 model is selected as the original model for PCB defect detection. Firstly, the K-means++ clustering algorithm is used to calculate the target anchor parameters which can enhance the dataset. Secondly, the receptive field enhancement (RFE) module is added to the head layer of the network to take full advantage of the receptive field in the feature map. Thirdly, the loss function CIoU of the YOLOv7 model is changed to WIoUv2. Fourthly, add the Triplet attention mechanism to the CBS and SPPCSPC modules. Finally, the detection accuracy of the improved YOLOv7 model is compared with that of Faster R-CNN, SSD, YOLOv3-tiny, YOLOv5s, and YOLOv7 models. The experimental results show that the detection accuracy and detection speed of the improved YOLOv7 model are enhanced compared with the original YOLOv7 model.</p></div>","PeriodicalId":19513,"journal":{"name":"Optik","volume":null,"pages":null},"PeriodicalIF":3.1000,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optik","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030402624004352","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0

Abstract

Deep learning gained great popularity in the task of object detection. This paper proposes a printed circuit board (PCB) defect detection algorithm based on deep learning, which can improve product quality and avoid potential failures and accidents in the electronics manufacturing industry. In this paper, the YOLOv7 model is selected as the original model for PCB defect detection. Firstly, the K-means++ clustering algorithm is used to calculate the target anchor parameters which can enhance the dataset. Secondly, the receptive field enhancement (RFE) module is added to the head layer of the network to take full advantage of the receptive field in the feature map. Thirdly, the loss function CIoU of the YOLOv7 model is changed to WIoUv2. Fourthly, add the Triplet attention mechanism to the CBS and SPPCSPC modules. Finally, the detection accuracy of the improved YOLOv7 model is compared with that of Faster R-CNN, SSD, YOLOv3-tiny, YOLOv5s, and YOLOv7 models. The experimental results show that the detection accuracy and detection speed of the improved YOLOv7 model are enhanced compared with the original YOLOv7 model.

基于深度学习的 PCB 缺陷检测算法
深度学习在物体检测任务中大受欢迎。本文提出了一种基于深度学习的印刷电路板(PCB)缺陷检测算法,可以提高产品质量,避免电子制造业中潜在的故障和事故。本文选取 YOLOv7 模型作为 PCB 缺陷检测的原始模型。首先,利用 K-means++ 聚类算法计算目标锚参数,从而增强数据集。其次,在网络的头部层添加感受野增强(RFE)模块,以充分利用特征图中的感受野。第三,将 YOLOv7 模型的损失函数 CIoU 改为 WIoUv2。第四,在 CBS 和 SPPCSPC 模块中加入三重注意机制。最后,比较了改进后的 YOLOv7 模型与 Faster R-CNN、SSD、YOLOv3-tiny、YOLOv5s 和 YOLOv7 模型的检测精度。实验结果表明,与原始 YOLOv7 模型相比,改进后的 YOLOv7 模型的检测精度和检测速度都有所提高。
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来源期刊
Optik
Optik 物理-光学
CiteScore
6.90
自引率
12.90%
发文量
1471
审稿时长
46 days
期刊介绍: Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.
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