Kyeongwoo Jang;Yuseong Jang;Soobin An;Soo-Yeon Lee
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引用次数: 0
Abstract
We present an in-situ IGZO/ITON heterojunction phototransistor with exceptional performance under visible light. By introducing a low bandgap of ITON as a light absorption layer, the responsivity of 30.2 A/W, photosensitivity of
$6.3\times 10^{{4}}$
, and detectivity of
$4.8\times 10^{{13}}$
Jones under red light illumination (635nm). Because the ITON was deposited by the sputtering with controlling Ar/N
2
gas mixture condition immediately after IGZO deposition without breaking the vacuum, the suggested structure is not only compatible with the conventional large-area manufacturing process but also minimizes the interfacial defects between IGZO and ITON.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.