Compressed Test Pattern Generation for Deep Neural Networks

IF 3.6 2区计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Transactions on Computers Pub Date : 2024-09-11 DOI:10.1109/tc.2024.3457738

Dina A. Moussa, Michael Hefenbrock, Mehdi Tahoori

引用次数: 0

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深度神经网络的压缩测试模式生成

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Computers 工程技术-工程：电子与电气

CiteScore

6.60

自引率

5.40%

发文量

199

审稿时长

6.0 months

期刊介绍： The IEEE Transactions on Computers is a monthly publication with a wide distribution to researchers, developers, technical managers, and educators in the computer field. It publishes papers on research in areas of current interest to the readers. These areas include, but are not limited to, the following: a) computer organizations and architectures; b) operating systems, software systems, and communication protocols; c) real-time systems and embedded systems; d) digital devices, computer components, and interconnection networks; e) specification, design, prototyping, and testing methods and tools; f) performance, fault tolerance, reliability, security, and testability; g) case studies and experimental and theoretical evaluations; and h) new and important applications and trends.