Innovative Reverse Current Coupling Layout of SiC Power Module for Parasitic Inductance Reduction

IF 2.9 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Ying Wang;Xi Jiang;Song Yuan;Nianlong Ma;Runze Ouyang;Daoyong Jia;Xiaowu Gong;Zhenjiang Pang;Lei Wen;Haimin Hong;Hao Niu
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引用次数: 0

Abstract

In this article, an innovative layout is introduced to reduce the stray inductance of the multichip power modules (MCPMs) through reverse coupling of current in parallel power loops, which effectively cancels out mutual inductance. A half-bridge silicon carbide (SiC) MOSFET power module was designed based on this novel layout. The fabricated SiC power module was experimentally validated, demonstrating a measured stray inductance of about 3.5 nH. Experimental results confirmed that the proposed module outperforms counterpart commercial SiC MOSFET power modules in terms of turn-off overshoot voltage and switching loss reduction, highlighting the advantage of the reverse-coupling current approach in enhancing power module performance. The principle of enhancing negative mutual inductance and dynamic current sharing in circuits through the reverse coupling parallel loops is discussed.
减少寄生电感的创新型碳化硅功率模块反向电流耦合布局
本文介绍了一种创新布局,通过并联电源回路中电流的反向耦合,有效抵消互感,从而降低多芯片电源模块(MCPM)的杂散电感。根据这种新颖的布局设计了一个半桥碳化硅(SiC)MOSFET 功率模块。经实验验证,所制造的碳化硅功率模块的杂散电感测量值约为 3.5 nH。实验结果证实,所提出的模块在关断过冲电压和降低开关损耗方面优于同类商用碳化硅 MOSFET 功率模块,凸显了反向耦合电流方法在提高功率模块性能方面的优势。本文讨论了通过反向耦合并联环路增强电路中负互感和动态电流分担的原理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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