{"title":"I4P: An Igor Pro suite for photoemission analysis","authors":"Rémi Lazzari","doi":"10.1016/j.elspec.2024.147474","DOIUrl":null,"url":null,"abstract":"<div><p>A package based on the <em>Igor Pro</em> scripting language is proposed for the analysis of photoemission spectroscopy data (XPS, HAXPES, UPS). Compared to the already numerous available softwares, the <em>Igor Pro Paris Photoemission Package (I4P)</em> gathers in a single tool: (i) basic data analysis and plotting features (such as satellite/ghost line deconvolution, inelastic background subtraction, determination of the intensity-energy response function and its correction, peak overlap, energy-mass conversion in ion scattering spectroscopy), (ii) databases of binding energies, of photo-ionization cross sections, of inelastic/transport mean free paths and effective attenuation lengths, (iii) quantification based on elastic peak areas accounting for elastic scattering, (iv) depth profiling by angle-resolved photoemission and by inelastic background analysis, (iv) peak fitting with 17 different line shapes including background and fully configurable constraints between fit parameters. Aside a detailed manual including the references to the relevant literature, <em>I4P</em> comes not only with a graphical interface but also with scripting commands. Most of all, the free availability of the source code allows the potential user to easily develop additional options of data treatment.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"275 ","pages":"Article 147474"},"PeriodicalIF":1.8000,"publicationDate":"2024-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electron Spectroscopy and Related Phenomena","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0368204824000574","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
A package based on the Igor Pro scripting language is proposed for the analysis of photoemission spectroscopy data (XPS, HAXPES, UPS). Compared to the already numerous available softwares, the Igor Pro Paris Photoemission Package (I4P) gathers in a single tool: (i) basic data analysis and plotting features (such as satellite/ghost line deconvolution, inelastic background subtraction, determination of the intensity-energy response function and its correction, peak overlap, energy-mass conversion in ion scattering spectroscopy), (ii) databases of binding energies, of photo-ionization cross sections, of inelastic/transport mean free paths and effective attenuation lengths, (iii) quantification based on elastic peak areas accounting for elastic scattering, (iv) depth profiling by angle-resolved photoemission and by inelastic background analysis, (iv) peak fitting with 17 different line shapes including background and fully configurable constraints between fit parameters. Aside a detailed manual including the references to the relevant literature, I4P comes not only with a graphical interface but also with scripting commands. Most of all, the free availability of the source code allows the potential user to easily develop additional options of data treatment.
为分析光发射光谱数据(XPS、HAXPES、UPS),提出了一个基于 Igor Pro 脚本语言的软件包。与现有的众多软件相比,Igor Pro 巴黎光发射软件包(I4P)将以下功能集于一身:(i) 基本数据分析和绘图功能(如卫星/幽灵线解卷积、非弹性背景减除、强度-能量响应函数的确定及其校正、峰重叠、离子散射光谱中的能量-质量转换),(ii) 结合能、光电离截面、非弹性/传输平均值、能量-质量转换、能量-质量转换的数据库、非弹性/传输平均自由路径和有效衰减长度数据库,(iii) 基于弹性散射的弹性峰面积进行量化,(iv) 通过角度分辨光发射和非弹性背景分析进行深度剖析,(iv) 利用 17 种不同的线形(包括背景)和完全可配置的拟合参数之间的约束条件进行峰值拟合。除了包含相关文献参考资料的详细手册外,I4P 不仅有图形界面,还有脚本命令。最重要的是,免费提供的源代码允许潜在用户轻松开发更多数据处理选项。
期刊介绍:
The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.