Acoustic Shock-Induced Low Dielectric Loss in Glycine and Oxalic Acid-Based Single Crystals

IF 1.5 4区 材料科学 Q3 Chemistry
Deepa Muniraj, Raju Suresh Kumar, Abdulrahman I. Almansour, Ikhyun Kim, S. A. Martin Britto Dhas
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引用次数: 0

Abstract

Glycinium oxalate (GO) and Bis(glycinium) oxalate (BGO) crystals are successfully grown using the slow evaporation solution growth technique. Following their growth, the crystals are subjected to a series of acoustic shock pulses. The effects of these shock pulses on the structural, optical, dielectric, and morphological properties of the crystals are comprehensively analyzed using various characterization techniques, including powder X-ray diffraction (XRD), UV-Visible spectroscopy, dielectric spectroscopy, and optical microscopy. Structural analysis through XRD reveals shifts in diffraction peak positions, indicating structural deformations. Fourier transform infrared spectroscopy analysis assesses the chemical stability of GO and BGO under shocked conditions. UV-Visible spectroscopy shows alterations in optical transmission with successive shock pulses, attributed to structural and surface defects. Dielectric properties are investigated over a frequency range from 1 Hz to 1 MHz, revealing variations in dielectric constant and loss tangent, which provide insights into the electrical behavior of the materials under normal and shocked conditions. Optical and scanning electron microscopy examine surface morphology, visualizing defects induced by the shock pulses. This study highlights the significant impact of shock pulses on the structural properties, optical transmission, dielectric properties, and surface morphology of GO and BGO crystals, offering valuable information on their resilience under dynamic conditions and potential applications.

声震诱导甘氨酸和草酸基单晶的低介电损耗
利用缓慢蒸发溶液生长技术成功生长出草酸甘氨酸(GO)和草酸双甘氨酸(BGO)晶体。晶体生长后,对其进行了一系列声学冲击脉冲。利用各种表征技术,包括粉末 X 射线衍射 (XRD)、紫外-可见光谱、介电光谱和光学显微镜,全面分析了这些冲击脉冲对晶体的结构、光学、介电和形态特性的影响。通过 X 射线衍射进行的结构分析表明,衍射峰位置发生了移动,这表明发生了结构变形。傅立叶变换红外光谱分析评估了 GO 和 BGO 在冲击条件下的化学稳定性。紫外-可见光谱分析显示,在连续的冲击脉冲下,光学透射率会发生变化,这归因于结构和表面缺陷。介电性能的研究频率范围为 1 Hz 至 1 MHz,揭示了介电常数和损耗正切的变化,有助于深入了解材料在正常和冲击条件下的电学行为。光学显微镜和扫描电子显微镜检查表面形态,观察冲击脉冲引起的缺陷。这项研究强调了冲击脉冲对 GO 和 BGO 晶体的结构特性、光学传输、介电特性和表面形态的重大影响,为它们在动态条件下的恢复能力和潜在应用提供了宝贵的信息。
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来源期刊
CiteScore
2.50
自引率
6.70%
发文量
121
审稿时长
1.9 months
期刊介绍: The journal Crystal Research and Technology is a pure online Journal (since 2012). Crystal Research and Technology is an international journal examining all aspects of research within experimental, industrial, and theoretical crystallography. The journal covers the relevant aspects of -crystal growth techniques and phenomena (including bulk growth, thin films) -modern crystalline materials (e.g. smart materials, nanocrystals, quasicrystals, liquid crystals) -industrial crystallisation -application of crystals in materials science, electronics, data storage, and optics -experimental, simulation and theoretical studies of the structural properties of crystals -crystallographic computing
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