{"title":"Maintenance optimization methodology of edge cloud collaborative systems based on a gateway cost index in IIoT","authors":"","doi":"10.1016/j.ress.2024.110370","DOIUrl":null,"url":null,"abstract":"<div><p>In the Industrial Internet of Things (IIoT), cloud computing faces enormous data processing pressure and security challenges due to the surge in industrial devices and sensors, especially in real-time data processing and analysis applications. However, fewer researchers study the reliability of data transmission and the maintenance of data interruption processing of edge cloud collaborative systems (ECCS) in IIoT. This paper proposes a maintenance optimization methodology of ECCS based on a gateway cost index. Firstly, a reliability model of different network topologies of ECCS is proposed considering key communication indicators of task runtime, packet loss rate, and bandwidth. Then, considering the impact of external environments on ECCS, an importance-based Gateway Cost Index is proposed. A maintenance optimization is studied by conducting a multi-objective programming. The specific maintenance steps are analyzed when the intelligent gateways of ECCS are subjected to large-scale failures caused by external interference. At last, two numerical examples with star topology and bus topology are provided to demonstrate the proposed methods.</p></div>","PeriodicalId":54500,"journal":{"name":"Reliability Engineering & System Safety","volume":null,"pages":null},"PeriodicalIF":9.4000,"publicationDate":"2024-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability Engineering & System Safety","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0951832024004423","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
引用次数: 0
Abstract
In the Industrial Internet of Things (IIoT), cloud computing faces enormous data processing pressure and security challenges due to the surge in industrial devices and sensors, especially in real-time data processing and analysis applications. However, fewer researchers study the reliability of data transmission and the maintenance of data interruption processing of edge cloud collaborative systems (ECCS) in IIoT. This paper proposes a maintenance optimization methodology of ECCS based on a gateway cost index. Firstly, a reliability model of different network topologies of ECCS is proposed considering key communication indicators of task runtime, packet loss rate, and bandwidth. Then, considering the impact of external environments on ECCS, an importance-based Gateway Cost Index is proposed. A maintenance optimization is studied by conducting a multi-objective programming. The specific maintenance steps are analyzed when the intelligent gateways of ECCS are subjected to large-scale failures caused by external interference. At last, two numerical examples with star topology and bus topology are provided to demonstrate the proposed methods.
期刊介绍:
Elsevier publishes Reliability Engineering & System Safety in association with the European Safety and Reliability Association and the Safety Engineering and Risk Analysis Division. The international journal is devoted to developing and applying methods to enhance the safety and reliability of complex technological systems, like nuclear power plants, chemical plants, hazardous waste facilities, space systems, offshore and maritime systems, transportation systems, constructed infrastructure, and manufacturing plants. The journal normally publishes only articles that involve the analysis of substantive problems related to the reliability of complex systems or present techniques and/or theoretical results that have a discernable relationship to the solution of such problems. An important aim is to balance academic material and practical applications.