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IF 1.9 4区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Design & Test Pub Date : 2024-06-20 DOI:10.1109/mdat.2024.3393829

Scott Davidson

引用次数: 0

Abstract

Many who have worked for vertically integrated companies making both ICs and computer equipment have experience in tracking ICs in the field. This is the subject of this issue of IEEE Design&Test on Silicon Lifecycle Management. If your company dealt with high-end equipment, where every failure mattered, you could close the loop on IC quality and see the failure rate of parts in use.

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IC 电话主页！

许多在生产集成电路和计算机设备的垂直一体化公司工作过的人都有在现场跟踪集成电路的经验。这就是本期 IEEE Design&Test 关于硅生命周期管理的主题。如果您的公司经营的是高端设备，每一个故障都很重要，那么您就可以对集成电路质量进行闭环管理，了解正在使用的部件的故障率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80

自引率

5.00%

发文量

期刊介绍： IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.