Roshaun C. Titus;Miriam R. Rath;Rosario A. Gerhardt;J. Elliott Fowler
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引用次数: 0
Abstract
The use of electronics substrates, such as printed circuit boards (PCBs) in modern technology has become nearly ubiquitous. As PCBs become smaller, denser and mass produced, printed, interdigitated circuit (IDC) sensors are increasingly utilized to qualify the geometric, material and process decisions for manufacturing electronics assemblies. Despite this, the accuracy in determining reproducibility and reliability of printed circuit designs for these applications is not well studied. In this article we report on the usage of small signal ac impedance spectroscopy to determine measurement repeatability and manufactured board reproducibility as a function of frequency, humidity and solder mask coverage for a single IDC design. These measurements allowed detection of systematic changes in the electrical response as the frequency (10MHz-0.1Hz) and humidity were varied (96%-10%RH). Our ac impedance results indicate that the measurement repeatability error is better than 0.6% while circuit or board reproducibility ranges from 2.5%-5.2%. Detailed surface analysis of the circuit structures indicated that differences observed were primarily due to porosity in the solder mask as well as differences in solder coating thickness and coverage between the interdigitated combs. Results are explained by a model that considers water surface adsorption, then infusion into the pore space and finally diffusion through the solder mask as the humidity of the ambient increased. These effects were most easily detected using imaginary electric modulus M” vs log frequency plots. It is anticipated that this methodology will have application to other circuit designs, solder mask or contamination variability.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.