The Challenge of Lower Temperature Soldering for Large Ball-Grid Array Board-Level Assembly Process

HongWen Zhang, Tyler Richmond, Huaguang Wang, Francis Mutuku
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Abstract

Lower temperature soldering has been considered as one of the effective ways to reduce the risk of warpage on PCB assembly. Use of lower-temperature solders, including a BiSnAgCu eutectic and two In-containing, Bi-free solders DFLT (Durafuse® LT), and DFLT-2 has been attempted to reflow the 40mmx40mm plastic ball grid array (PBGA928). BiSnAg, under the combinations of reflow profiles P185 and P200 (~185°C and ~200°C peak temperature) and the paste-to-ball (P2B) volume ratio (0.13, 0.25, and 0.5), always formed defective joints. Under the P200 profile with P2B volume ratio of 0.5, SAC305/BiSnAg joints were dominated exclusively by hot-tearing and shrinkage voids despite forming the desired drum shape. Using P220 profile (~220°C peak temperature, right above the liquidus temperature of SAC305) with P2B ratio of 0.13, SAC/BiSnAg had presented the drum shape joint and free of hot-tearing and shrinkage voids. With the constant P2B volume ratio of 0.13, P200 also renders various malformed joints for both DFLT and DFLT-2. The major challenge will be the insufficient molten solder volume under low temperature soldering to accommodate the displacement caused by the warpage. Increasing reflow temperature improved the joint shape and greatly reduced the defects for both DFLT and DFLT-2. Under P220, both SAC/DFLT and SAC/DFLT-2 joints achieved the desired short-and-fat drum shape, comparable to those reflowed under P240. The formation of the optimal joint for all three pastes under the hot profiles is attributed to the sufficient liquid solder volume since both paste and SAC ball fully melt and merge, which compensates the displacement caused by the dynamic warpage. Both SAC/DFLT and SAC/DFLT-2 joints exhibited the limited hot-tearing under the P200 profile while SAC/BiSnAg joints were dominated by those defects. The different metallurgy of DFLT and DFLT -2 did not result in an enlarged pasty range after joining with SAC305 and thus led to the lower defect rate. Investigation of the joint reliability performance is still ongoing.
大型球栅阵列板级装配工艺面临的低温焊接挑战
低温焊接被认为是降低印刷电路板组装翘曲风险的有效方法之一。我们尝试使用低温焊料,包括 BiSnAgCu 共晶焊料和两种含 In 无 Bi 焊料 DFLT(Durafuse® LT)和 DFLT-2 来回流 40mmx40mm 塑料球栅阵列 (PBGA928)。在 P185 和 P200 回流曲线(峰值温度分别为 ~185°C 和 ~200°C)以及锡膏与球体 (P2B) 体积比(0.13、0.25 和 0.5)的组合下,BiSnAg 始终会形成缺陷焊点。在 P2B 体积比为 0.5 的 P200 曲线下,尽管形成了理想的鼓形,但 SAC305/BiSnAg 接头完全被热撕裂和收缩空洞所占据。使用 P220 型材(峰值温度约为 220°C,正好高于 SAC305 的液相温度),P2B 比为 0.13 时,SAC/BiSnAg 接头呈现鼓形,没有热撕裂和收缩空洞。在 P2B 体积比恒定为 0.13 的情况下,P200 也会在 DFLT 和 DFLT-2 中产生各种畸形接缝。主要挑战在于低温焊接下熔融焊料体积不足以容纳翘曲引起的位移。提高回流焊温度可改善 DFLT 和 DFLT-2 的焊点形状并大大减少缺陷。在 P220 温度下,SAC/DFLT 和 SAC/DFLT-2 焊点都达到了理想的短扁鼓形状,与在 P240 温度下回流的焊点相当。在热曲线下,三种焊膏都能形成最佳焊点,这是因为焊膏和 SAC 焊球完全熔化融合后有足够的液态焊料体积,从而补偿了动态翘曲造成的位移。在 P200 温度曲线下,SAC/DFLT 和 SAC/DFLT-2 焊点都表现出有限的热撕裂,而 SAC/BiSnAg 焊点则主要存在这些缺陷。DFLT 和 DFLT -2 的冶金学不同,在与 SAC305 连接后不会导致糊状范围扩大,因此缺陷率较低。有关连接可靠性能的研究仍在进行中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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