PEAR: Unbalanced Inter-Page Errors Aware Read Scheme for Latency-Efficient 3-D NAND Flash

IF 2.5 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Meng Zhang;Fei Wu;Qin Yu;Changsheng Xie
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引用次数: 0

Abstract

Although three-dimensional (3D) NAND flash memory has demonstrated impressive benefits including high capacity and storage density, data reliability is now a major worry because of long-term storage and ongoing cell wear-out. Low-density parity-check (LDPC) codes are frequently utilized in flash storage systems because of their superior error correcting capabilities to guarantee data reliability. LDPC codes can be hard-decoded or soft-decoded with significant differences depending on the raw bit error rate (RBER). By using fine-grained memory sensing operations, high RBER leads to increased decoding iterations for hard-decoding and more read levels for soft-decoding. In order to reduce the number of decoding iterations and read levels by lowering the RBER, this paper proposes an unbalanced inter-page errors aware read strategy for 3D NAND flash memory, called PEAR. A preliminary experiment is initially carried out to demonstrate that high RBER causes an increase in the number of decoding iterations and read levels. The substantial RBER fluctuation between pages is next analyzed from the viewpoint of the threshold voltage shift. Finally, PEAR properly places the read voltages between the two states with the most and second-most electrons in accordance with the phenomenon of threshold voltage drift, enabling the employment of hard-decoding with low read levels and successfully avoiding soft-decoding procedures with larger RBER. According to simulation results, PEAR can dramatically reduce RBER, decoding iterations, read levels, and read latency.
PEAR:针对延迟高效 3-D NAND 闪存的非平衡页间错误感知读取方案
尽管三维(3D)NAND 闪存已显示出令人印象深刻的优势,包括高容量和存储密度,但由于长期存储和持续的单元损耗,数据可靠性现在已成为一个主要问题。低密度奇偶校验(LDPC)码因其出色的纠错能力而经常被用于闪存系统中,以保证数据的可靠性。LDPC 代码可以是硬解码,也可以是软解码,根据原始比特错误率(RBER)的不同,两者之间存在显著差异。通过使用细粒度内存传感操作,高 RBER 会导致硬解码的解码迭代次数增加,而软解码的读取级数增加。为了通过降低 RBER 来减少解码迭代次数和读取级别,本文提出了一种针对 3D NAND 闪存的不平衡页间错误感知读取策略,称为 PEAR。初步实验表明,高 RBER 会导致解码迭代次数和读取级别的增加。接下来,我们从阈值电压偏移的角度分析了页面间 RBER 的大幅波动。最后,PEAR 根据阈值电压漂移现象,正确地将读取电压置于电子数最多和次多的两个状态之间,实现了低读取电平下的硬解码,并成功避免了 RBER 较大时的软解码程序。根据仿真结果,PEAR 可显著降低 RBER、解码迭代次数、读取电平和读取延迟。
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来源期刊
IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability 工程技术-工程:电子与电气
CiteScore
4.80
自引率
5.00%
发文量
71
审稿时长
6-12 weeks
期刊介绍: The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.
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