{"title":"A Reinforcement Learning Framework With Region-Awareness and Shared Path Experience for Efficient Routing in Networks-on-Chip","authors":"Kamil Khan, Sudeep Pasricha","doi":"10.1109/mdat.2023.3306719","DOIUrl":null,"url":null,"abstract":"In this article, the authors introduce a regional congestion-aware reinforcement learning (RL)-based routing policy for Network-on-Chip (NoC) architectures.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"21 1","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2023-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3306719","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, the authors introduce a regional congestion-aware reinforcement learning (RL)-based routing policy for Network-on-Chip (NoC) architectures.
期刊介绍:
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.