Surface structural analysis of CaF2(111) using low-energy atom scattering spectroscopy

IF 2.4 3区材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS

Journal of Vacuum Science & Technology A Pub Date : 2023-05-30 DOI:10.1116/6.0002392

Hiroaki Fukuta, Goon Tan, Tomoaki Oga, Akifumi Matsuda, Mamoru Yoshimoto, Kenji Umezawa

引用次数: 0

Abstract

We determined the surface structure of cleaved CaF2(111) via atomic force microscopy and low-energy atom scattering spectroscopy for surface analyses of insulators. A pulsed 3 keV-20Ne0 impinged on the sample. The backscattered particles were detected at a scattering angle of 180°. It was found that (1) fluorine atoms dominated the topmost surfaces of cleaved CaF2(111) and (2) the topmost layer of fluorine atoms was located at an inward shift of 0.2 Å with respect to the bulk lattice structure.

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利用低能原子散射光谱分析CaF2(111)的表面结构

我们通过原子力显微镜和低能原子散射光谱分析了劈裂CaF2(111)的表面结构。脉冲3kv - 20ne0撞击样品。后向散射粒子的散射角为180°。结果发现:(1)氟原子主导了劈裂CaF2(111)的最上层表面，(2)相对于体晶格结构，最上层氟原子位于向内移动0.2 Å的位置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Vacuum Science & Technology A 工程技术-材料科学：膜

CiteScore

5.10

自引率

10.30%

发文量

247

审稿时长

2.1 months

期刊介绍： Journal of Vacuum Science & Technology A publishes reports of original research, letters, and review articles that focus on fundamental scientific understanding of interfaces, surfaces, plasmas and thin films and on using this understanding to advance the state-of-the-art in various technological applications.