The 3D stack in short form (memory chip packaging)

J. Minahan, A. Pepe, R. Some, M. Suer
{"title":"The 3D stack in short form (memory chip packaging)","authors":"J. Minahan, A. Pepe, R. Some, M. Suer","doi":"10.1109/ECTC.1992.204230","DOIUrl":null,"url":null,"abstract":"A novel form of 3D high-density stack, called a short stack, has been built and tested. One version of the short stack allowed accurate measurement of the T-connect resistance, approximately=0.025 ohms, while a second version was designed to provide four memory chips stacked for use in a low headroom application that incorporated the 3D technology with the high-density interconnect multichip approach.<<ETX>>","PeriodicalId":125270,"journal":{"name":"1992 Proceedings 42nd Electronic Components & Technology Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 Proceedings 42nd Electronic Components & Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1992.204230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

A novel form of 3D high-density stack, called a short stack, has been built and tested. One version of the short stack allowed accurate measurement of the T-connect resistance, approximately=0.025 ohms, while a second version was designed to provide four memory chips stacked for use in a low headroom application that incorporated the 3D technology with the high-density interconnect multichip approach.<>
简写的3D堆栈(存储芯片封装)
一种新型的三维高密度叠层,称为短叠层,已经建立并测试。短堆栈的一个版本允许精确测量t -连接电阻,大约=0.025欧姆,而第二个版本旨在提供四个存储芯片堆叠,用于低空间应用,将3D技术与高密度互连多芯片方法相结合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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