Practical applications of photo-defined micro-via technology (PhotoLink/sup TM/)

B. McDermott, Sid Tryzbiak
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引用次数: 1

Abstract

Current high density SMT designs and many of the future designs, as we move towards Chip-Scale Packaging (CSP), will require increased price/performance of the PCB. Conventional mechanical drilling and blind/buried via technologies are reaching their design limitations. Photoimageable dielectrics may be the most cost effective and the least time to market of the higher density technologies. This is a fundamental change in the way we make PCB's. It will provide the process capability in terms of via size to meet the longer term interconnect density requirements. This technology is available today to enable the implementation of higher density SMT and CSP designs. It provides significant advantages in terms of physical design rules and also electrical design.
照片定义微孔技术的实际应用(PhotoLink/sup TM/)
当前的高密度SMT设计和许多未来的设计,随着我们向芯片级封装(CSP)的发展,将需要更高的PCB价格/性能。传统的机械钻井和盲孔/埋孔技术已经达到了它们的设计极限。光成像电介质可能是高密度技术中最具成本效益和上市时间最短的。这是我们制造PCB的方式的根本改变。它将在通孔尺寸方面提供工艺能力,以满足长期互连密度要求。目前,该技术可用于实现更高密度的SMT和CSP设计。它在物理设计规则和电气设计方面提供了显著的优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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