{"title":"Evidence of mechanical Film Breakdown and ESCA Analysis of a Film on Thermally Aged Cobalt Hardened Gold","authors":"J. Thomas","doi":"10.1109/TPHP.1976.1135129","DOIUrl":null,"url":null,"abstract":"Electron spectroscopy for chemical analysis (ESCA) has been used to determine the chemical formulation of thermally grown films on cobalt hardened-gold electroplate (150°C/8000 h). K2S04 (or SO3) ~ 60-A, thickness has been identified overlaying a 50-A-thick CoO layer on cobalt hardened gold. It was found that the dielectric breakdown voltage of this complex film depends on contact force. At Iow contact forces (~10-2N), electronic (as opposed to thermal) dielectric breakdown events are observed at a critical voltage of ~ 3.5 V. I-V characteristics are typically nonohmic. Mechanical film breakdown is evidenced by ohmic I-V characteristics. A statistically important number of mechanical breakthrough events are observed at 0.2-N contact force.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Parts, Hybrids, and Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TPHP.1976.1135129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Electron spectroscopy for chemical analysis (ESCA) has been used to determine the chemical formulation of thermally grown films on cobalt hardened-gold electroplate (150°C/8000 h). K2S04 (or SO3) ~ 60-A, thickness has been identified overlaying a 50-A-thick CoO layer on cobalt hardened gold. It was found that the dielectric breakdown voltage of this complex film depends on contact force. At Iow contact forces (~10-2N), electronic (as opposed to thermal) dielectric breakdown events are observed at a critical voltage of ~ 3.5 V. I-V characteristics are typically nonohmic. Mechanical film breakdown is evidenced by ohmic I-V characteristics. A statistically important number of mechanical breakthrough events are observed at 0.2-N contact force.