Solder ball robustness study on polymer core solder balls for BGA packages

Y. B. Kar, Tan Cai Hui, A. Agileswari, C. Lo
{"title":"Solder ball robustness study on polymer core solder balls for BGA packages","authors":"Y. B. Kar, Tan Cai Hui, A. Agileswari, C. Lo","doi":"10.1109/IEMT.2012.6521760","DOIUrl":null,"url":null,"abstract":"Restriction of Hazardous Substance (RoHS) Regulation came into effect in 2006 due to the hazardous effects of lead to human's health and toxicity for environment. As such, the leaded solder ball was replaced by lead-free solder ball which is now widely used in semiconductor industries. However, there was a concern on the robustness of lead-free solder ball especially on drop ball issues when compared to lead solder ball, especially when subjected to reliability stress tests. The polymer core solder ball was invented to solve the drop ball issue. Polymer core solder ball with an additional polymer core inside the solder functions as a stress buffer to dissipate stress better compared to the current conventional lead-free solder ball. However, a new problem arises which is the formation of Kirkendall voids in between the Copper (Cu) and solder interface which results in poor reliability performance. This formation of voids could be due to the faster diffusion from Cu to Tin (Sn) than Sn to Cu. Therefore, an additional Nickel (Ni) layer is coated on top of Cu to overcome this problem. The function of Ni is to limit / reduce the diffusion from Cu to Sn thus preventing the formation of Kirkendall voids. This enhances the robustness of the solder ball joint. The solder ball shear strength test and tray drop test were conducted in this research study under different reliability stress conditions such as temperature cycle (TC) and high temperature storage (HTS) stress to verify the robustness and the reliability of the polymer core solder balls. The solder ball shear strength experiment was conducted via Dage 4000 series bond tester and drop reliability test was carried out via the tray drop test. It is observed that the shear strength for polymer core solder ball without Ni coating layer decreased in TC and HTS stress condition and the tray drop test reliability is the worst in HTS 1008 hours. This is due to the excessive formation of Kirkendall voids resulting from the faster diffusion rate from Cu to Sn than Sn to Cu. From this research study, it can be concluded that the polymer core solder ball with an additional of Ni coating layer gives higher joint strength and better drop reliability performance compared to the polymer core solder ball without additional Ni coating layer.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521760","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

Restriction of Hazardous Substance (RoHS) Regulation came into effect in 2006 due to the hazardous effects of lead to human's health and toxicity for environment. As such, the leaded solder ball was replaced by lead-free solder ball which is now widely used in semiconductor industries. However, there was a concern on the robustness of lead-free solder ball especially on drop ball issues when compared to lead solder ball, especially when subjected to reliability stress tests. The polymer core solder ball was invented to solve the drop ball issue. Polymer core solder ball with an additional polymer core inside the solder functions as a stress buffer to dissipate stress better compared to the current conventional lead-free solder ball. However, a new problem arises which is the formation of Kirkendall voids in between the Copper (Cu) and solder interface which results in poor reliability performance. This formation of voids could be due to the faster diffusion from Cu to Tin (Sn) than Sn to Cu. Therefore, an additional Nickel (Ni) layer is coated on top of Cu to overcome this problem. The function of Ni is to limit / reduce the diffusion from Cu to Sn thus preventing the formation of Kirkendall voids. This enhances the robustness of the solder ball joint. The solder ball shear strength test and tray drop test were conducted in this research study under different reliability stress conditions such as temperature cycle (TC) and high temperature storage (HTS) stress to verify the robustness and the reliability of the polymer core solder balls. The solder ball shear strength experiment was conducted via Dage 4000 series bond tester and drop reliability test was carried out via the tray drop test. It is observed that the shear strength for polymer core solder ball without Ni coating layer decreased in TC and HTS stress condition and the tray drop test reliability is the worst in HTS 1008 hours. This is due to the excessive formation of Kirkendall voids resulting from the faster diffusion rate from Cu to Sn than Sn to Cu. From this research study, it can be concluded that the polymer core solder ball with an additional of Ni coating layer gives higher joint strength and better drop reliability performance compared to the polymer core solder ball without additional Ni coating layer.
BGA封装用聚合物芯焊锡球的稳健性研究
由于铅对人类健康的危害和对环境的毒性,《有害物质限制条例》(RoHS)于2006年生效。因此,含铅焊锡球被现在广泛应用于半导体工业的无铅焊锡球所取代。然而,与含铅焊锡球相比,无铅焊锡球的稳健性令人担忧,特别是在落球问题上,特别是在进行可靠性压力测试时。为了解决掉球问题,发明了聚合物芯焊锡球。与目前传统的无铅焊料球相比,在焊料内附加聚合物芯的聚合物芯焊料球具有应力缓冲作用,可以更好地消除应力。然而,在铜与焊料界面之间形成了Kirkendall空洞,导致可靠性差。这种孔洞的形成可能是由于Cu到Tin (Sn)的扩散速度比Sn到Cu的扩散速度快。因此,一层额外的镍(Ni)层被涂在铜的顶部来克服这个问题。Ni的作用是限制/减少Cu向Sn的扩散,从而防止Kirkendall空洞的形成。这提高了焊料球接头的坚固性。本研究在温度循环(TC)和高温储存(HTS)应力等不同可靠性应力条件下进行了焊锡球剪切强度试验和托盘跌落试验,验证了聚合物芯焊锡球的鲁棒性和可靠性。通过Dage 4000系列粘结试验机进行了焊球抗剪强度试验,通过托盘跌落试验进行了跌落可靠性试验。结果表明,无Ni涂层的聚合物芯焊料球在高温高温和高温高温应力条件下抗剪强度降低,在高温高温1008小时时托盘跌落试验可靠性最差。这是由于Cu到Sn的扩散速度比Sn到Cu的扩散速度快,导致过量的Kirkendall空洞形成。通过本研究可以得出结论,与未添加Ni涂层的聚合物芯焊锡球相比,添加Ni涂层的聚合物芯焊锡球具有更高的接头强度和更好的跌落可靠性性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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