A Spectroscopic SEM: First Results

M. Osterberg, A. Khursheed
{"title":"A Spectroscopic SEM: First Results","authors":"M. Osterberg, A. Khursheed","doi":"10.1109/IPFA.2006.250996","DOIUrl":null,"url":null,"abstract":"Using a circular beam separator to deflect the primary beam of an SEM through 90deg, an aberration limited final probe size of 7-8 nm has been achieved in experiments. This limit was shown to be due to magnetic leakage fields from the post-deflector lens and not due to aberrations of the beam separator. In fact, it is concluded that the beam separator aberrations are within 2 nm over a 1 mum by 1 mum field-of-view, in agreement with previous simulation predictions. The results presented in this paper therefore confirm the feasibility of the spectroscopic SEM concept, from the imaging point of view, the next step is to acquire energy spectra. To further improve on the current setup, it is clear that a post-deflector lens without significant magnetic leakage field must be used. In addition, the lens should not be a transmission type as the SPSSEM relies on scattered electrons travelling back towards the beam separator. Such a lens has been designed and manufactured and is an immersion magnetic lens design which will be useful not only for imaging but also for spectrum experiments in the future","PeriodicalId":283576,"journal":{"name":"2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2006.250996","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Using a circular beam separator to deflect the primary beam of an SEM through 90deg, an aberration limited final probe size of 7-8 nm has been achieved in experiments. This limit was shown to be due to magnetic leakage fields from the post-deflector lens and not due to aberrations of the beam separator. In fact, it is concluded that the beam separator aberrations are within 2 nm over a 1 mum by 1 mum field-of-view, in agreement with previous simulation predictions. The results presented in this paper therefore confirm the feasibility of the spectroscopic SEM concept, from the imaging point of view, the next step is to acquire energy spectra. To further improve on the current setup, it is clear that a post-deflector lens without significant magnetic leakage field must be used. In addition, the lens should not be a transmission type as the SPSSEM relies on scattered electrons travelling back towards the beam separator. Such a lens has been designed and manufactured and is an immersion magnetic lens design which will be useful not only for imaging but also for spectrum experiments in the future
A光谱扫描电镜:初步结果
利用圆形光束分离器将扫描电镜的主光束偏转90°,实验中实现了像差限制的最终探针尺寸为7 ~ 8 nm。这个极限被证明是由于后偏转镜透镜的漏磁场,而不是由于光束分离器的像差。事实上,我们得出的结论是,在1 μ m × 1 μ m的视场范围内,光束分离器的像差在2 nm以内,与之前的模拟预测一致。因此,本文的结果证实了光谱扫描电镜概念的可行性,从成像的角度来看,下一步是获取能谱。为了进一步改进目前的设置,显然必须使用没有明显漏磁场的后偏转透镜。此外,透镜不应该是透射型的,因为SPSSEM依赖于向光束分离器返回的散射电子。该透镜是一种浸没式磁透镜,不仅可用于成像,而且可用于未来的光谱实验
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信