{"title":"A new testable design of logic circuits under highly observable condition","authors":"W. Xiaoqing, H. Tamamoto, K. Kinoshita","doi":"10.1109/ATS.1994.367231","DOIUrl":null,"url":null,"abstract":"This paper presents the concept of k-FR circuits. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k+1)+1 tests render the highly observable condition. K is usually two or three. The paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the concept of k-FR circuits. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k(k+1)+1 tests render the highly observable condition. K is usually two or three. The paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit.<>