Collation of the Electronic Components Intended to Spacecraft Eqiupment Critical to SEE

Abstract

The paper presents SEE test results of COTS components considering to be applying in satellite equipment and critical to SEL and/or catastrophic failure. They were provided to confirm electronic components required hardness level and to define of the survivability in latched condition if SEL were observed during the experiment. In several cases LET thresholds were determined as it was specified in the requirements.