Dual-Vt design of FPGAs for subthreshold leakage tolerance

Akhilesh Kumar, M. Anis
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引用次数: 12

Abstract

In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures
用于亚阈值泄漏容限的fpga双vt设计
本文提出了一种降低亚阈值泄漏功率的双vt FPGA结构。提出了一种基于双vt分配算法和布置的CAD流程来实现双vt FPGA结构。逻辑块中的逻辑元素是双vt赋值的候选对象。我们提出了一种架构,其中有两种逻辑块,一种具有所有高vt逻辑元素,另一种具有固定百分比的高vt逻辑元素。然后将这两种逻辑块放置在FPGA架构保持规则的方式中。结果表明,在双vt赋值的理想情况下,95%以上的逻辑元件可以赋值为高vt。结果表明,该方法可节省55%的泄漏量。研究了两种逻辑块的不同比例的设计权衡。双vt FPGA CAD流程旨在开发和评估双vt FPGA架构
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