{"title":"New insights on the ESD behavior and failure mechanism of multi wall CNTs","authors":"A. Mishra, M. Shrivastava","doi":"10.1109/IRPS.2016.7574609","DOIUrl":null,"url":null,"abstract":"In this work, for the first time we experimentally determine ESD behavior of individual shells of both single and bundles of MWCNTs. Distinct electrothermal transport, under ESD conditions, through inner and outer shells of MWCNT is explored. ESD time scale current annealing behavior of outer and inner shells was discovered, which is unique to MWCNTs. Shells - by - shell failure was confirmed to be the universal failure mode of MWCNTs. Failure behaviors of suspended and collapsed (tubes resting on dielectric surface) tubes in single and bundled configuration are discussed.","PeriodicalId":172129,"journal":{"name":"2016 IEEE International Reliability Physics Symposium (IRPS)","volume":"224 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2016.7574609","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this work, for the first time we experimentally determine ESD behavior of individual shells of both single and bundles of MWCNTs. Distinct electrothermal transport, under ESD conditions, through inner and outer shells of MWCNT is explored. ESD time scale current annealing behavior of outer and inner shells was discovered, which is unique to MWCNTs. Shells - by - shell failure was confirmed to be the universal failure mode of MWCNTs. Failure behaviors of suspended and collapsed (tubes resting on dielectric surface) tubes in single and bundled configuration are discussed.