Hardware and Software Combined Detection of SystemLevel ESD-Induced Soft Failures

2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2018-09-01 DOI:10.23919/EOS/ESD.2018.8509783

Seep Vora, Rui Jiang, P. Vijayaraj, Keven Feng, Yang Xiu, Shobha Vasudevan, E. Rosenbaum

引用次数: 7

Abstract

A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience soft failures. Voltage monitors are used to correlate the occurrence of those failures with the magnitude of noise on power supplies.

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系统级静电诱发软故障的软硬件联合检测

半定制微控制器经受IEC-61000-4-2 ESD。扫描链和存储器读出程序能够识别经历软故障的硬件块。电压监测器用于将这些故障的发生与电源上的噪声大小联系起来。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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