{"title":"A Digital BIST Methodology for Spread Spectrum Clock Generators","authors":"Maohsuan Chou, Jen-Chien Hsu, C. Su","doi":"10.1109/ATS.2006.8","DOIUrl":null,"url":null,"abstract":"In this paper, a built-in-self-test methodology for spread-spectrum clock generators is presented. It utilizes a multi-phase phase detector to detect the linearity of the frequency variation and the short-term jitter. The methodology is analyzed and simulated. As an all digital design, the hardware overhead is very small","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this paper, a built-in-self-test methodology for spread-spectrum clock generators is presented. It utilizes a multi-phase phase detector to detect the linearity of the frequency variation and the short-term jitter. The methodology is analyzed and simulated. As an all digital design, the hardware overhead is very small