MCM LGA package with optical I/O passively aligned to dual layer polymer waveguides in PCB

F. Libsch, R. Budd, P. Chiniwalla, P. Hobbs, M. Mastro, J. Sanford, J. Xu
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引用次数: 10

Abstract

Over the past 30 years, IBM has provided leadership in high density I/O density and count interconnects at both chip and package levels as has been necessary for processor chips in high end symmetrical multiple processor (SMP) servers. For example, IBM introduced multi-chip modules (MCMs) in the 1970's, thermal conduction modules (TCMs) in the 1980's, and advanced organic micro-via buildup-layer packages in the 1990's (Patel, 2005). Typically, MCMs are necessary to provide significant increases in bandwidth between chips on the module, compared to the alternative route of lower bandwidth resulting from chip-to-chip interconnects going through the printed circuit board (PCB) for single chip modules (SCMs). CMOS chip-to-package pad scaling gap has been growing compared to the package-to-printed circuit board (PCB) pad scaling, which is the reason for the I/O advantage of MCMs vs. SCMs. For example, today's mainstream IC-to-package flipchip bonding uses 0.1 mm square pads on 0.2 mm pitch, with 0.15 mm ramping up, while the package-to-PCB ball- or land grid array (BGA or LGA) pitch uses 1-mm pitch, an areal density as much as 64 times lower. However, even with the larger bandwidth advantage of MCMs, more complex chips such as multiprocessor cores and the need for higher bandwidth to memory cache require a relatively larger number of signal I/Os, as well as more power and ground I/Os. Faster I/O clocks further exacerbate the need for more package I/O by forcing the transition from previous single-ended I/Os to differential signal I/Os to satisfy the higher frequency bit error rate specifications on SMP buses. Our goal is to alleviate the I/O bottleneck at the packaging level in the most cost effective manner, while providing the lowest risk, most flexible development package. To this end, we present our work on an electrical LGA field replaceable package with optical components. These optical components enable larger I/O bandwidth density between the MCM and PCB than that allowed by a standard electrical package
MCM LGA封装,光学I/O被动对准PCB中的双层聚合物波导
在过去的30年中,IBM在芯片和封装级别的高密度I/O密度和计数互连方面一直处于领先地位,这是高端对称多处理器(SMP)服务器中的处理器芯片所必需的。例如,IBM在20世纪70年代推出了多芯片模块(mcm),在80年代推出了热传导模块(TCMs),在90年代推出了先进的有机微通孔积层封装(Patel, 2005)。通常,mcm对于显著增加模块上芯片之间的带宽是必要的,相比之下,单芯片模块(scm)通过印刷电路板(PCB)实现芯片对芯片互连所产生的较低带宽的替代途径。与封装到印刷电路板(PCB)的扩展相比,CMOS芯片到封装的扩展差距一直在扩大,这就是mcm相对于scm具有I/O优势的原因。例如,当今主流的集成到封装的倒装芯片键合使用0.1毫米的平方焊盘在0.2毫米的间距上,增加0.15毫米的间距,而封装到pcb的球或栅格阵列(BGA或LGA)间距使用1毫米的间距,面密度低64倍。然而,即使mcm具有更大的带宽优势,更复杂的芯片(如多处理器内核)和对更高带宽的内存缓存的需求也需要相对更多的信号I/ o,以及更多的电源和接地I/ o。更快的I/O时钟迫使从以前的单端I/O转换到差分信号I/O,以满足SMP总线上更高频率的误码率规范,从而进一步加剧了对更多封装I/O的需求。我们的目标是以最具成本效益的方式缓解封装级别的I/O瓶颈,同时提供风险最低、最灵活的开发软件包。为此,我们介绍了一种带有光学元件的电气LGA现场可更换封装的工作。这些光学元件使MCM和PCB之间的I/O带宽密度比标准电气封装所允许的带宽密度大
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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