{"title":"Timing verification of a 45nm SOI standard cell library","authors":"J. Pelloie, Y. Laplanche, C. Hawkins, Roma Kundu","doi":"10.1109/SOI.2010.5641402","DOIUrl":null,"url":null,"abstract":"A reliable timing verification methodology has been developed and proven on a 45nm SOI standard cell library. This methodology is currently used at more advanced process nodes.","PeriodicalId":227302,"journal":{"name":"2010 IEEE International SOI Conference (SOI)","volume":"105 7S 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International SOI Conference (SOI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOI.2010.5641402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A reliable timing verification methodology has been developed and proven on a 45nm SOI standard cell library. This methodology is currently used at more advanced process nodes.
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