E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, Kazutoshi Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, M. Sugihara
{"title":"Radiation-Induced Soft Errors","authors":"E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, Kazutoshi Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, M. Sugihara","doi":"10.1007/978-4-431-56594-9_3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design and Test for Systems Dependability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-4-431-56594-9_3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}