LED device fault diagnosis base on neural network and SVM model analysis

Haisu Jiang, Qingzhong Ma, Fuqin Yang, Mingming Shen
{"title":"LED device fault diagnosis base on neural network and SVM model analysis","authors":"Haisu Jiang, Qingzhong Ma, Fuqin Yang, Mingming Shen","doi":"10.1109/IFWS.2017.8245971","DOIUrl":null,"url":null,"abstract":"LED as the 4th generation new energy lighting device, it is widely used in many lighting fields with its green environmental protection, energy saving, long life and high reliability. It is of great significance to study the common fault diagnosis technology of LED devicesto determine the fault point and improve the design of LED devices. This article from the common failure mode of the LED devices, combined with the monitoring the related parameters of the LED devices, use based on BP neural network and SVM algorithm, analyze the fault diagnosis of LED Devices, concluded from the results, the SVM method in effective under the condition of small sample has good diagnosis effect.","PeriodicalId":131675,"journal":{"name":"2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)","volume":"237 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IFWS.2017.8245971","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

LED as the 4th generation new energy lighting device, it is widely used in many lighting fields with its green environmental protection, energy saving, long life and high reliability. It is of great significance to study the common fault diagnosis technology of LED devicesto determine the fault point and improve the design of LED devices. This article from the common failure mode of the LED devices, combined with the monitoring the related parameters of the LED devices, use based on BP neural network and SVM algorithm, analyze the fault diagnosis of LED Devices, concluded from the results, the SVM method in effective under the condition of small sample has good diagnosis effect.
基于神经网络和支持向量机模型分析的LED器件故障诊断
LED作为第四代新能源照明器件,以其绿色环保、节能、长寿命、高可靠性等优点被广泛应用于众多照明领域。研究LED器件常见的故障诊断技术,对确定LED器件的故障点,改进LED器件的设计具有重要意义。本文从LED器件的常见故障模式出发,结合对LED器件相关参数的监测,采用基于BP神经网络和SVM算法,对LED器件的故障诊断进行了分析,从结果中得出结论,SVM方法在有效的小样本条件下具有良好的诊断效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信