{"title":"An IEEE 1149.1 based test access architecture for ICs with embedded cores","authors":"L. Whetsel","doi":"10.1109/TEST.1997.639596","DOIUrl":null,"url":null,"abstract":"This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"125","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639596","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 125
Abstract
This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
