A MEMS based device interface board

2010 IEEE International Test Conference Pub Date : 2010-11-01 DOI:10.1109/TEST.2010.5699296

Nabeeh Kandalaft, I. Basith, R. Rashidzadeh

引用次数: 7

Abstract

At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and the tester. Simulation results indicate that the proposed scheme can operate up to 50 GHz without considerable signal integrity degradation.

查看原文本刊更多论文

基于MEMS的器件接口板

在千兆赫频率范围内，器件接口板的性能下降增加了良率损失和制造成本。在这张海报中，提出了一种基于MEMS的解决方案来设计器件接口板(DIB)，支持被测器件与测试仪之间的高速连接。仿真结果表明，该方案可在50ghz频率下工作，且信号完整性无损。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2010 IEEE International Test Conference

自引率

0.00%

发文量