K. Matsumoto, M. Ishii, J. Shirakashi, K. Segawa, Y. Oka, B.J. Vartanian, J. S. Harris
{"title":"Comparison of experimental and theoretical results of room temperature operated single electron transistor made by STM/AFM nano-oxidation process","authors":"K. Matsumoto, M. Ishii, J. Shirakashi, K. Segawa, Y. Oka, B.J. Vartanian, J. S. Harris","doi":"10.1109/IEDM.1995.499215","DOIUrl":null,"url":null,"abstract":"The experimental results of the single electron transistor (SET) operated at room temperature, which was fabricated by a scanning tunneling microscope (STM)/an atomic force microscope (AFM) nano-oxidation process, was compared with the results of calculated values, and a good coincidence between them was obtained. This coincidence confirms the existence of the Coulomb blockade phenomena in our SET even at room temperature.","PeriodicalId":137564,"journal":{"name":"Proceedings of International Electron Devices Meeting","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1995.499215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The experimental results of the single electron transistor (SET) operated at room temperature, which was fabricated by a scanning tunneling microscope (STM)/an atomic force microscope (AFM) nano-oxidation process, was compared with the results of calculated values, and a good coincidence between them was obtained. This coincidence confirms the existence of the Coulomb blockade phenomena in our SET even at room temperature.