Anand model calibration for SAC305 solder joints based on the evolution of the shear stress and strain hysteresis loops for different thermal cycling conditions

J. Libot, Zoé Bussière, L. Mahfouz, J. Alexis, O. Dalverny
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Abstract

Since 2006 and the introduction of the RoHS legislation preventing the use of lead in electronic assemblies, lead-free solder alloys have gained interest amongst the industry and academics with the introduction of new solder alloy compositions. Solder joint durability has been widely studied, especially the SAC305 solder composition, one of the most common lead-free alloy used in electronic equipment. Assessing solderjoint durability can consists in performing Accelerated Temperature Cycling (ATC) tests to measure durability data. Finite Element Analysis (FEA) can also be performed in order to correlate a thermomechanical fatigue criterion, such as the inelastic strain energy density, with the durability data for different test configurations to develop a fatigue model. However, accurately calculating the inelastic strain energy density dissipated in solder interconnections during thermal cycling requires knowledge of the solder material’s behavior law. Under thermal cycling conditions, SAC305 solder behaves as a highly viscoplastic material and is often described using the Anand model.This study presents the methodology considered to determine the Anand viscoplastic model representative of actual SAC305 solder joints. The experimental procedure which consists of a custom-made 76 I/O Ceramic Ball Grid Array (CBGA76) assembly instrumented with four strain gauges and subjected to three different thermal cycling conditions is described $(\triangle \mathrm{T}=[-25^{\circ}\mathrm{C}, 125^{\circ}\mathrm{C}], [0^{\circ}\mathrm{C}, 100^{\circ}\mathrm{C}]$ and [−40°C, 85°C]). The strain gauges allow to determine the shear stresses and shear strains applied on the critical solder balls during temperature cycles. The obtained experimental shear stress and strain hysteresis loops are compared with the numerical hysteresis loops determined with the FEA. By assessing the effect of each Anand parameter on the shape of the hysteresis loop plotted for the thermal cycle between −25°C to 125°C, the best-fit parameters for the Anand viscoplastic model was derived. The model was then validated considering the temperature cycles between −40°C to 85°C and 0°C to 100°C.
基于不同热循环条件下SAC305焊点剪切应力和应变滞回曲线演变的Anand模型标定
自2006年以来,RoHS立法禁止在电子组件中使用铅,无铅焊料合金随着新的焊料合金成分的引入而引起了工业界和学术界的兴趣。人们对焊点的耐久性进行了广泛的研究,尤其是SAC305焊点成分,这是电子设备中最常用的无铅合金之一。评估焊点耐久性可以通过执行加速温度循环(ATC)测试来测量耐久性数据。有限元分析(FEA)也可以进行,以便将热机械疲劳准则(如非弹性应变能密度)与不同测试配置的耐久性数据相关联,以建立疲劳模型。然而,准确计算在热循环过程中焊料互连中耗散的非弹性应变能密度需要了解焊料材料的行为规律。在热循环条件下,SAC305焊料表现为高粘塑性材料,通常使用Anand模型进行描述。本研究提出了确定SAC305实际焊点的Anand粘塑性模型的方法。实验程序由定制的76 I/O陶瓷球栅阵列(CBGA76)组件组成,该组件配有四个应变片,并经历三种不同的热循环条件,描述为$(\triangle \ mathm {T}=[-25^{\circ}\ mathm {C}, 125^{\circ}\ mathm {C}], [0^{\circ}\ mathm {C}, 100^{\circ}\ mathm {C}]$和[- 40°C, 85°C])。应变计可以确定在温度循环期间施加在关键焊料球上的剪切应力和剪切应变。实验得到的剪切应力和应变迟滞回线与有限元计算得到的数值迟滞回线进行了比较。通过评估每个Anand参数对在- 25°C至125°C热循环中绘制的滞回线形状的影响,得出了Anand粘塑性模型的最佳拟合参数。然后考虑−40°C至85°C和0°C至100°C的温度循环,对模型进行验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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