{"title":"A digital method for phase noise measurement","authors":"A. Ecker, Kenneth Blakkan, M. Soma","doi":"10.1109/TEST.2012.6401537","DOIUrl":null,"url":null,"abstract":"To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.","PeriodicalId":353290,"journal":{"name":"2012 IEEE International Test Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2012.6401537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
