Total Dose and Single Event Testing of a Hardened Point of Load Regulator

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI:10.1109/REDW.2010.5619501

N. V. van Vonno, L. Pearce, J. S. Gill, H. W. Satterfield, E. T. Thomson, T. E. Fobes, A. P. Williams, P. J. Chesley

引用次数: 21

Abstract

We report the results of total dose and single-event effects testing of the ISL70001SRH hardened point of load (POL) voltage regulator and discuss part design, performance and applications. The part is implemented in a submicron BiCMOS process and uses integrated power MOSFET switching transistors.

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负载调节器硬化点的总剂量和单事件试验

本文报道了ISL70001SRH负载硬化点(POL)稳压器的总剂量和单事件效应测试结果，并讨论了部分设计、性能和应用。该器件采用亚微米BiCMOS工艺，采用集成功率MOSFET开关晶体管。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2010 IEEE Radiation Effects Data Workshop

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