Mixed-signal testing using Walsh functions

Abstract

The paper suggests an accurate and simple approach to frequency testing of analog and mixed-signal circuits in the digital domain. The method is aimed at reducing the cost of test (CoT) for systems-on-chip (SoC) devices while taking advantage of digital resources already present in the SoC devices, and using low-cost digital testers, respectively. It is based on Walsh functions, the Fast Walsh Transformation (FWT) and a simple digital processing algorithm. Since both test signal generation and test response analysis are performed on-chip, it leads to an efficient and robust approach very suitable to built-in self-test (BIST) applications, too. Considerations for on-chip implementation are also addressed together with simulation and experimental results that validate the feasibility of the proposed approach.