{"title":"Study of an active thermal recovery mechanism for an electrostatically actuated RF-MEMS switch","authors":"T. Kuenzig, J. Iannacci, G. Schrag, G. Wachutka","doi":"10.1109/ESIME.2012.6191766","DOIUrl":null,"url":null,"abstract":"We present a comprehensive study on an electrostatically actuated RF-MEMS switch with active thermal recovery capability intended to counteract stiction. On the basis of finite element (FE) simulations a detailed model including all relevant physical effects has been developed to investigate this recovery mechanism. The resulting model enables to reproduce the whole recovery process during a failure situation of the switch, proving its functionality and, thus, identifying and elaborating possible design improvements. The simulated results are confirmed by experimental data obtained from white-light interferometry (VEECO) and laser-Doppler vibrometry (Polytec).","PeriodicalId":319207,"journal":{"name":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"145 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2012.6191766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
We present a comprehensive study on an electrostatically actuated RF-MEMS switch with active thermal recovery capability intended to counteract stiction. On the basis of finite element (FE) simulations a detailed model including all relevant physical effects has been developed to investigate this recovery mechanism. The resulting model enables to reproduce the whole recovery process during a failure situation of the switch, proving its functionality and, thus, identifying and elaborating possible design improvements. The simulated results are confirmed by experimental data obtained from white-light interferometry (VEECO) and laser-Doppler vibrometry (Polytec).