Crosstalk issues in flip chip multichip modules

E. Godshalk, M. Bruns, T. Ruttan
{"title":"Crosstalk issues in flip chip multichip modules","authors":"E. Godshalk, M. Bruns, T. Ruttan","doi":"10.1109/EPEP.1995.524867","DOIUrl":null,"url":null,"abstract":"A multilayer 2.5 Gbit/sec superconducting Multichip Module (MCM) has been modeled to investigate the feasibility of meeting specified performance goals. Due to the high speeds required flip chip bonding of the Josephson Junction Integrated Circuits (IC's) is used. The MCM is comprised of both Polyimide (PI) dielectric and Mullite ceramic substrates, forming in effect an MCM-D/MCM-C hybrid structure. Niobium (Nb) low temperature superconductor (LTS) is used on the PI dielectric layers to form IC-data and IC-control nets that connect from chip to chip with transmission-line impedance of 2 and 8 ohms, respectively. In the Mullite layers, Tungsten (W) is used for clock, data in, data out, and control lines, all of 32 ohms, that connect from the IC's to the MCM I/O ports.","PeriodicalId":253331,"journal":{"name":"Proceedings of Electrical Performance of Electronic Packaging","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1995.524867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A multilayer 2.5 Gbit/sec superconducting Multichip Module (MCM) has been modeled to investigate the feasibility of meeting specified performance goals. Due to the high speeds required flip chip bonding of the Josephson Junction Integrated Circuits (IC's) is used. The MCM is comprised of both Polyimide (PI) dielectric and Mullite ceramic substrates, forming in effect an MCM-D/MCM-C hybrid structure. Niobium (Nb) low temperature superconductor (LTS) is used on the PI dielectric layers to form IC-data and IC-control nets that connect from chip to chip with transmission-line impedance of 2 and 8 ohms, respectively. In the Mullite layers, Tungsten (W) is used for clock, data in, data out, and control lines, all of 32 ohms, that connect from the IC's to the MCM I/O ports.
倒装多片模块中的串扰问题
建立了一种多层2.5 Gbit/s超导多芯片模块(MCM)模型,以研究满足特定性能目标的可行性。由于高速所需的倒装芯片键合的约瑟夫森结集成电路(IC)被使用。MCM由聚酰亚胺(PI)介质和莫来石陶瓷衬底组成,实际上形成了MCM- d /MCM- c混合结构。在PI介电层上采用铌(Nb)低温超导体(LTS)形成芯片间连接的ic数据网和ic控制网,其传输在线阻抗分别为2欧姆和8欧姆。在Mullite层中,钨(W)用于时钟、数据输入、数据输出和控制线,所有32欧姆,从IC连接到MCM I/O端口。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书