Using sulfide treatment to improve performance of GaSb/GaInAsSb/GaAlAsSb photodiode heterostructures for spectral range, of 1.7-2.5 /spl mu/m

I. Andreev, T. V. L’vova, M. Mikhailova, E. Kunitsyna, V.A. Soldv'ev, Y. Yakovlev
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引用次数: 2

Abstract

We have investigated passivation of GaSb and its quaternary GalnAsSb, and GaAlAsSb alloys in Na/sub 2/S and (NH/sub 4/)/sub 2/S water solutions. It has been found that these semiconductors are etched in the used sulfide solutions. We have found the etching rates and kinetics of the etching processes. Basing on the obtained results we have determined optimal technological conditions for the passivation of GaSb-substrate before liquid phase epitaxy growing of the quaternary layers. The layers of the grown heterostructures have been shown a small lattice mismatch and have exhibited a good abruptness interface. We have also used the sulfide treatment to passivate the side surface GaSb/GaInAsSb/GaAlAsSb photodiode heterostructures. Reduction of reverse dark current by a factor of 2-10 times was achieved.
采用硫化物处理提高了GaSb/GaInAsSb/GaAlAsSb光电二极管异质结构的性能,光谱范围为1.7-2.5 /spl mu/m
本文研究了GaAlAsSb及其四系GalnAsSb和GaAlAsSb合金在Na/sub 2/S和(NH/sub 4/)/sub 2/S水溶液中的钝化。已经发现这些半导体在使用的硫化物溶液中被蚀刻。我们发现了蚀刻速率和蚀刻过程的动力学。在此基础上,确定了四层薄膜液相外延生长前衬底钝化的最佳工艺条件。生长的异质结构的各层表现出较小的晶格失配,并表现出良好的陡度界面。我们还使用硫化物处理钝化侧面GaSb/GaInAsSb/GaAlAsSb光电二极管异质结构。反向暗电流减少了2-10倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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